SN74BCT8374ADWR
Texas Instruments
- Lifecycle status Active
- RoHS RoHS Compliant
- DescriptionIC SCAN TEST DEVICE W/FF 24-SOIC
- CategoryLogic - Specialty Logic
-
ECAD Model
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In Stock: 124
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Technical Details
- Series:74BCT
- Package:Tape & Reel (TR)
- Part Status:Obsolete
- Logic Type:Scan Test Device with D-Type Edge-Triggered Flip-Flops
- Supply Voltage:4.5V ~ 5.5V
- Number of Bits:8
- Operating Temperature:0°C ~ 70°C
- Mounting Type:Surface Mount
- Package / Case:24-SOIC (0.295", 7.50mm Width)
- Supplier Device Package:24-SOIC
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