SN74BCT8374ADWRG4

Texas Instruments
  • Lifecycle status Active
  • RoHS RoHS Compliant
  • DescriptionIC SCAN TEST DEVICE 24SOIC
  • CategoryLogic - Specialty Logic
  • ECAD Model
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In Stock: 162

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Technical Details

  • Series:74BCT
  • Package:Tape & Reel (TR)
  • Part Status:Obsolete
  • Logic Type:Scan Test Device with D-Type Edge-Triggered Flip-Flops
  • Supply Voltage:4.5V ~ 5.5V

 

  • Number of Bits:8
  • Operating Temperature:0°C ~ 70°C
  • Mounting Type:Surface Mount
  • Package / Case:24-SOIC (0.295", 7.50mm Width)
  • Supplier Device Package:24-SOIC

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