SN74BCT8240ANTG4
Texas Instruments
- Lifecycle status Active
- RoHS RoHS Compliant
- DescriptionIC SCAN TEST DEVICE BUFF 24-DIP
- CategoryLogic - Specialty Logic
-
ECAD Model
- Share
In Stock: 156
Can ship immediately
Pricing:
Call for price or sumbit a RFQ
Quote It
Technical Details
- Series:74BCT
- Package:Tube
- Part Status:Obsolete
- Logic Type:Scan Test Device with Inverting Buffers
- Supply Voltage:4.5V ~ 5.5V
- Number of Bits:8
- Operating Temperature:0°C ~ 70°C
- Mounting Type:Through Hole
- Package / Case:24-DIP (0.300", 7.62mm)
- Supplier Device Package:24-PDIP
Related Products
IC SCAN TEST DEVICE BUFF 24-DIP
Call for price
IC SCAN TEST DEVICE TXRX 24-DIP
Call for price
IC SCAN TEST DEVICE LATCH 24SOIC
Call for price
IC SCAN TEST DEVICE W/FF 24-SOIC
Call for price
IC SCAN TEST DEVICE W/FF 24-SOIC
Call for price
IC SCAN TEST DEVICE W/FF 24-DIP
Call for price
IC FULL ADDER 4BIT BIN 16SO
Call for price
IC REGISTERED TXRX 8BIT 52-QFP
Call for price
IC TXRX 8BIT TTL/BTL 52-QFP
Call for price
IC TXRX 7BIT TTL/BTL 52-QFP
Call for price