SN74BCT8373ADWRG4
Texas Instruments
- Lifecycle status Active
- RoHS RoHS Compliant
- DescriptionIC SCAN TEST DEVICE 24SOIC
- CategoryLogic - Specialty Logic
-
ECAD Model
- Share
In Stock: 188
Can ship immediately
Pricing:
Call for price or sumbit a RFQ
Quote It
Technical Details
- Series:74BCT
- Package:Tape & Reel (TR)
- Part Status:Obsolete
- Logic Type:Scan Test Device with D-Type Latches
- Supply Voltage:4.5V ~ 5.5V
- Number of Bits:8
- Operating Temperature:0°C ~ 70°C
- Mounting Type:Surface Mount
- Package / Case:24-SOIC (0.295", 7.50mm Width)
- Supplier Device Package:24-SOIC
Related Products
IC SCAN TEST DEVICE 24SOIC
Call for price
IC BINARY FULL ADDER 16SOIC
Call for price
IC BINARY FULL ADDER 16SOIC
Call for price
IC DELAY ELEMENT 16SOIC
Call for price
IC OSCILLATOR DRIVER US8
Call for price
IC SCHOTTKY BARRIER DIODE 16SOIC
Call for price
IC SCHOTTKY BARRIER DIODE 20SOIC
Call for price
